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Metal
Oxides
Metal Oxides
X-ray
truncation rod and grazing incidence
diffraction studies of the surface,
and near-surface, relaxations in
single crystal oxides (see illustration
for recent results in LaAlO3).
Studies of modulated structures
in both superconducting, and insulating
oxides. X-ray analysis of defect-induced
atomic displacement in oxide solid
solutions.
Semiconductors
Synchrotron
X-ray studies of self-organized
nanostructures
in ternary and quaternary III-V
semiconductor alloy films. Exploration
of both ordering and composition
modulation. Studies of novel
metal semiconducting silicides
grown
on silicon.
Glasses
These
include oxide and related glasses
in both thin
film
and bulk forms. Current work
includes thin SiO2 over
Si(001) and Ag ion
correlations in the rapid
ion conductor, AgI-AgPO3.
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Structure
of Molten Iron Chloride: Neutron
Scattering and Modeling, Physical
Review B, 57 (1998) 10496.
High
Resolution Radial Distribution
Function of Pure Amorphous
Silicon, Phys. Rev. Lett., 82 (1999)
3460.
X-Ray
Truncation Rod Analysis of the
Reversible Temperature-Dependent
Surface Structure of LaAlO3,
Phys.
Rev. B, 64 (2001) 235425.
Scattering
Studies of Real Materials, 2001
von Hippel
Award Presentation,
MRS Bulletin, 27 (2002) 539.
Lateral
Composition Modulation in (InAs)n/(AlAs)m
Short-Period Superlattices
Investigated by High-Resolution
X-Ray Scattering, Phys.
Rev. B, 66 (2002)
115312. |
